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Investigating atomic-scale solid-state properties with an SnV electrometer in diamond

T. Schröder1,2

Published in:

Conf. on Lasers and Electro-Optics (CLEO 2024), Charlotte, USA, May 5-10, ISBN 978-1-957171-39-5, p. FTu3I.7, doi:10.1364/CLEO_FS.2024.FTu3I.7 (2024).

Abstract:

We present an electrometer based on an optically-active spin defect in diamond with a non-linear Stark response. Using this sensor, we successfully localize charge traps, quantify their impact on transport dynamics and noise generation, analyze relevant material properties, and develop strategies for material optimization.

1 Institute of Physics, Humboldt University of Berlin, Newtonstr. 15, 12489 Berlin, Germany
2 Ferdinand-Braun-Institut, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany

Copyright © 2024 The Author(s).
© Optica Publishing Group 2024 Open Access Statement and Policy, Terms for Journal Article Reuse.

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