Defects and reliability of UVC-LEDs
M. Buffolo1, F. Piva1, N. Roccato1, C. De Santi1, T. Wernicke2, J. Höpfner2, M. Schilling2, A. Muhin2, N. Susilo2, D. Hauer-Vidal2, L. Sulmoni2, M. Kneissl2,3, N. Trivellin1, G. Meneghesso1, E. Zanoni1, M. Meneghini1
Published in:
Proc. of SPIE, vol. 13366, Gallium Nitride Materials and Devices XX, Photonics West, San Francisco, USA, Jan 17-22, 133660G (2025).
1 University of Padova, Italy
2 Technische Universität Berlin, Germany
3 Ferdinand-Braun-Institut (FBH), Germany
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