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Individual nanostructures in an epsilon-near-zero material probed with 3D-sculpted light

B. Kantor1,2,3, L. Ackermann4,5,6, V. Deinhart7,8, K. Höflich8, I. de Leon3,9,10 and P. Banzer1,2,3,4,5

Published in:

Opt. Express, vol. 32, no. 27, pp. 47800-47809, doi:10.1364/OE.541939 (2024).

Abstract:

Epsilon-near-zero (ENZ) materials, i.e., materials with a vanishing real part of the permittivity, have become an increasingly desirable platform for exploring linear and nonlinear optical phenomena in nanophotonic and on-chip environments. ENZ materials inherently enhance electric fields for properly chosen interaction scenarios, host extreme nonlinear optical effects, and lead to other intriguing phenomena. To date, studies in the optical domain have mainly focused on nanoscopically thin films of ENZ materials and their interaction with light and other nanostructured materials. Here, we experimentally and numerically explore the optical response of individual nanostructures milled into an ENZ material. For the study, we employ 3D structured light beams, allowing us to fully control polarization-dependent field enhancements enabled by a tailored illumination and a vanishing permittivity. Our studies provide insight between complex near-fields and the ENZ regime while showcasing the polarization-dependent controllability they feature. Such effects can form the basis for experimental realizations of extremely localized polarization-controlled refractive index changes, which can ultimately enable ultrafast switching processes at the level of individual nanostructures.

1 Institute of Physics, University of Graz, NAWI Graz, Universitätsplatz 5, 8010, Graz, Austria
2 Christian Doppler Laboratory for Structured Matter Based Sensing, Institute of Physics, Universitätsplatz 5, 8010, Graz, Austria
3 Max Planck–University of Ottawa Centre for Extreme and Quantum Photonics, 25 Templeton St., Ottawa, ON K1N 6N5, Canada
4 Institute of Photonic Technologies, Friedrich-Alexander-Universität Erlangen-Nürnberg, Konrad-Zuse-Straße 3/5, Erlangen, 91052, Germany
5 School of Advanced Optical Technologies, Friedrich-Alexander-Universität Erlangen-Nürnberg, Paul-Gordan-Straße 6, Erlangen, 91052, Germany
6 Galatea Laboratory, Ècole Polytechnique Fèdèrale de Lausanne (EPFL), Rue de la Maladière 71b, 2000 Neuchâtel, Switzerland
7 Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, 14109 Berlin, Germany
8 Ferdinand-Braun-Institut, Leibniz-Institut für Höchfrequenztechnik (FBH), Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
9 ASML Netherlands B.V., De Run 6501, 5504 DR Veldhoven, The Netherlands
10 School of Engineering and Sciences, Tecnologico de Monterrey, Eugenio Garza Sada 2501, Monterrey 64849, NL, Mexico

Topics:

Nonlinear effects, Phase modulation, Refractive index, Structured light, Thin films, Transparent conducting oxides

Published by Optica Publishing Group under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

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