Method for in-depth characterization of electro-optic phase modulators
B. Arar1, M. Schiemangk1, H. Wenzel1, O. Brox1, A. Wicht1,2, A. Peters2, and G. Tränkle1
Published in:
Appl. Opt., vol. 56, no. 4, pp. 1246-1252 (2017).
Abstract:
A flexible method to measure the modulation efficiency and residual amplitude modulation, including nonlinearities, of phase modulators is presented. The method is based on demodulation of the modulated optical field in the optical domain by means of a heterodyne interferometer and subsequent analysis of the I&Q quadrature components of the corresponding RF beat note signal. As an example, we determine the phase modulation efficiency and residual amplitude modulation for both the TE and TM modes of a GaAs chip-based phase modulator at the wavelength of 1064 nm. From the results of these measurements, we estimate the linear and quadratic electro-optic coefficients for a P-p-n-N GaAs/AlGaAs double heterostructure.
1 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany
2 Humboldt-Universität zu Berlin, 12489 Berlin, Germany
OCIS codes:
(130.0130) Integrated optics; (230.2090) Electro-optical devices; (120.0120) Instrumentation, measurement, and metrology.
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