Enhancing Dynamic Range and Accuracy of Load-Pull Measurements by Using Prematched Transistors
E. Ersoy, O. Bengtsson, and W. Heinrich
Published in:
9th German Microwave Conference (GeMiC 2015), Nürnberg, Germany, Mar. 16-18, ISBN 978-3-9812668-6-3, pp. 307-310 (2015).
Abstract:
This paper describes how dynamic range and accuracy of an on-wafer load pull measurement system can be improved without costly investment in equipment. Applying prematching to the transistors on the wafer reduces ohmic losses, leads to a better figure of merit ΔGT, and thus increases the accuracy of the whole system. The approach is verified for X-band GaN power transistors.
Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany
Keywords:
load-pull measurement, delta GT, power amplifier, X-Band, MMIC, galium-nitride.
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